INVESTIGATION OF CRYSTAL IMPERFECTIONS BY MULTIPLE INTERFEROMETERS
Keywords:
rotation, dilatational and mixed X – ray moires, segregation lines, shift lines, double two – and three – crystal interferometersAbstract
Stereometric investigations of the crystal imperfections by applying multiple interferometers are carried out. The disadvantages of the ordinary x – ray diffraction and x – ray interferometric investigation methods of the crystal inperfections are shown. A perfect method of stereometric topography for the revelation of the monocrystal defects is proposed. It is experimentally shown that by means of double and triple interferometers, it is possible to detect the segregation lines, the displacement lines and the moire patterns of different types of imperfections.
