PECULIARITIES OF MEASURING LINEAR PARAMETERS IN NANOMETER RANGE

Authors

  • M.G. TRAVAJYAN National Polytechnic University of Armenia Author
  • H.G. ASATRYAN National Polytechnic University of Armenia Author

Keywords:

nanorange, linear measurements, atomic force microscopy, measures

Abstract

The current uniformity state of linear measurements in the nanometer range, including tools for measurement are analyzed. The possibility of using the method of atomic force microscopy to measure the linear parameters of nano-objects is considered.

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Published

01.06.2026

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Section

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