EVEN MAGNETIC PHOTOEFFECT AND ITS APPLICATION FOR MEASURING THE ELECTROPHYSICAL PARAMETERS OF SEMICONDUCTORS

Authors

  • R.R. VARDANYAN National Polytechnic University of Armenia Author

Keywords:

semiconductor, photocurrent, magnetic field, measurement, parameters

Abstract

The phenomenon of decreasing the photocurrent of different semiconductor structures under the influence of a magnetic field is considered. This effect is called the “Even magnetic photo effect”. The wide possibilities of applying this effect in the development of new and nondestructive methods for measuring the electrophysical parameters of semiconductors are shown.

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Published

17.07.2026

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