AN AUTOMATED SYSTEM FOR MEASURING THE METASTABILITY PARAMETERS AND CALCULATING THE MEAN TIME BETWEEN THE FAILURES IN SYNCHRONIZERS
Keywords:
multi-clock SoC, metastability, timing constant, automated systemAbstract
Parallel to the development of modern technologies, the multi-clock domains in System on Chip are often used. They help to combine the work of different blocks in SoC. To synchronize the signals coming from other clock domains, synchronizers are used, which have a probability to enter the metastability, which may bring to a failure of the system.
Within the scope of this paper, methods for measuring the metastability parameters and calculating the mean time between the failures are investigated. The automated system is proposed which helps the designer to measure and calculate the mentioned parameters easily during the design verification of VLSI.
