ELECTRICAL STRENGTH OF THIN DIELECTRIC LAYERS AND THEIR PRESENTATION IN TERMS OF THE PROBABILITY DISTRIBUTION FUNCTION

Abstract

The probabilistic form of the dependence of the breakdown voltage (electric strength) of a dielectric located between the capacitor plates on the thickness of dielectric layers in the range from 0.1 mm to atomic thickness in uniform and non-uniform fields is considered. The results of already known experiments and analytical forms of the probability density of their distribution used in the presentations of the probability integral and its averaging are used in the work.