THIN FILM PRODUCTION OF CADMIUM SULFIDE BY THERMAL VACUUM DEPOSITION USING VARIOUS EVAPORATORS

Authors

  • V.S. Dekhtiarov CANDLE Synchrotron Research Institute Author
  • A.S. Yeremyan CANDLE Synchrotron Research Institute Author
  • A.T. Khachatryan CANDLE Synchrotron Research Institute Author

Keywords:

thin films, cadmium sulfide, tungsten evaporator, tantalum evaporator, ceramics crucible.

Abstract

The results of experimental studies on the production of thin films of high-purity cadmium sulfide on silicate glasses and copper substrates are presented. Analytical and practical results, as well as justifications for the applicability of different types of vaporizers made of different materials are introdueed. For experimental studies of the process of evaporation of cadmium sulfide, vaporizers made of tungsten and tantalum in the form of a boat, as well as a ceramic crucible with tungsten heater were selected. For all types of evaporators, a series of experiments with controlled heating were conducted to determine the kinetic and technological parameters of the growth of thin films. Processing of the obtained results made it possible to obtain data on the growth rate of films on the substrate for each type of evaporator. Multiple variations of parameters applied during the experiments allowed to determine the optimal parameters for the selected type of material and evaporator, as well as to reveal the operating conditions for the technology of obtaining high-quality films from cadmium sulfide while preserving the parameters of the original material. The results obtained on silicate glasses allowed to develop an optimal technology for obtaining thin films on oxygen-free copper substrates. To assess the quality and thickness of the studied films, an analysis was performed based on the optical properties of cadmium sulfide. The evaluation of the films by multiple reflection showed their compliance with the theoretical parameters given in the literature for the sprayed material and allowed to determine the thickness of the films with a high degree of accuracy. The correspondence of the films to the source material was evaluated by their optical characteristics using the absorption and transmission spectra.

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Published

19.10.2026

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