THE ELIPSOMETRICAL INVESTIGATIONS OF THE REFRACTIVE INDICES OF NANOSTRUCTURED CARBON THIN FILMS ON THE SURFACE OF GERMANIUM

Authors

J.R. PANOSYAN National Polytechnic University of Armenia Author
A.S. SAHAKYAN National Polytechnic University of Armenia Author
A.T. ABRAHAMYAN National Polytechnic University of Armenia Author

Keywords:

carbon films, refraction index, elipsometrical investigations, germanium surface

Abstract

The technology of production and research of diamond-like carbon coating are compared films on the surface of Ge is briefly stated. The experimental data for refractive index are compared with the theoretical works on the increase of dispersion in various media. An attempt to explain the obtained results is made.

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17.07.2026

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